Citation: | J. Ren, J. Wen, Z. Zhao, R. Yan, X. Chen, and A. Nandi, “Uncertainty-aware deep learning: A promising tool for trustworthy fault diagnosis,” IEEE/CAA J. Autom. Sinica, vol. 11, no. 6, pp. 1–14, Jun. 2024. doi: 10.1109/JAS.2024.124290 |
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